Improved TEM-cell for EMC tests of integrated circuits

Статья в сборнике трудов конференции

In this paper, the construction of TEM-cell, which can be used for tests on radiated susceptibility and emissions of integrated circuits in the frequency range up to 5 GHz, is presented. Constructional features and advantages of proposed TEM-cell compared with classic constriction are described. Electrodynamic simulation of construction is completed and results of the analysis of frequency dependencies of the magnitude of reflection vertical bar S-11 vertical bar and transmission vertical bar S-21 vertical bar coefficients are presented. Results of the simulation showed good matching with the 50 Ohm feeder (vertical bar S-11 vertical bar <= -20 dB) and low losses (vertical bar S-21 vertical bar >= -3 dB) in considered frequency range. Evaluation of nonuniformity of electric field strength in test volume is represented. Its value doesn't exceed 3 dB in the test volume of 30x30x5 mm(3).

Библиографическая запись: Demakov, A. V. Improved TEM-cell for EMC tests of integrated circuits / A. V. Demakov, M. E. Komnatnov // Proc. of IEEE 2017 International multi-conference on engineering, computer and information sciences (Novosibirsk, Akademgorodok, Russia, 18–24 Sep. 2017). – Novosibirsk: IEEE, 2017. – P. 399 – 402. – DOI:10.1109/SIBIRCON.2017.8109915.

Конференция:

• 2017 International Multi-Conference on Engineering, Computer and Information Sciences (SIBIRCON)
• Россия, Новосибирская область, Новосибирск, 18-24 сентября 2018,
• Международная

Издательство:

Institute of Electrical and Electronics Engineers Inc.

США, New York, Bushville