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Influence of Ultrashort Pulse Duration on Its Peak Values Localization in PCB of Spacecraft Autonomous Navigation System

Статья в сборнике трудов конференции

Importance of research on specific aspects of ultrashort pulse propagation and voltage peak values localization along printed circuit board (PCB) multiconductor bus is highlighted. Simulation of a trapezoidal ultrashort pulse propagating along conductors of the bus with a different number of excited conductors, fixed variation of the whole ultrashort pulse duration (3; 0.3; 0.03 ns) and a duration optimized by genetic algorithms has been carried out. In the case of one excited conductor, the maximum value exceeds by 18% the ultrashort pulse amplitude at the input and the greatest (by modulus) minimum value is -36% of 0.5 V level lower the level of zero. In the case of two conductors, the highest maximum value exceeds by 20% the ultrashort pulse amplitude at the input and the minimum is -40% of 0.5 V level lower the level of zero. It is shown that significant signal excess is observed with decreasing of ultrashort pulse duration both for maximum and minimum. Also, localization of voltage peak values is inconstant: they appear in different parts of PCB bus including different PCB layers. With the usage of optimization, a voltage maximum in the given conductor exceeds the 0.5 V level by 16%, when the whole duration of an ultrashort pulse is near 0.13 ns.

Библиографическая запись: Influence of Ultrashort Pulse Duration on Its Peak Values Localization in PCB of Spacecraft Autonomous Navigation System [Электронный ресурс] / R. R. Gazizov [et al.] ; 18th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) (June 29 2017-July 3 2017 ; Erlagol). - Electronic text data : IEEE Computer Society, 2017. - on-line // 18th International Conference on Young Specialists on Micro/Nanotechnologies and Electron Devices. - Erlagol : IEEE Computer Society, 2017. - p. 69-74. - DOI 10.1109/EDM.2017.7981710.

Конференция:

  • 18th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)
  • Россия, Алтай, 29-30 июля 2017,
  • Международная

Издательство:

Institute of Electrical and Electronics Engineers Inc.

Россия, Новосибирская область, Новосибирск

Год издания:  2017
Страницы:  69 - 74
Язык:  Английский
DOI:  10.1109/EDM.2017.7981710
Индексируется в Scopus, Web of science