Automatic device for testing thermal resistance with thermoelectric effect

Статья в журнале

This paper presents the results of the developed device for testing thermal resistance of thermointerface. Experiments to determine thermal resistance in different cases of thermal interface application were carried out. Dependence of thermoEMF value is obtained, which occurs between semiconductor element body and cooling system radiator at different quality of thermal interface application.

Журнал:

• Journal of Physics: Conference Series
• Institute of Physics Publishing (Bristol)

Библиографическая запись: Automatic device for testing thermal resistance with thermoelectric effect [Electronic resource] / I. M. Vasiliev [et al.] // Journal of Physics: Conference Series. – 2020. – Vol. 1499. – Iss. 1. – P. 012047. – DOI: 10.1088/1742-6596/1499/1/012047

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• Scopus ( https://www.scopus.com/record/display.uri?eid=2-s2.0-85086718706&origin=resultslist )
• РИНЦ ( https://www.elibrary.ru/item.asp?id=43302726 )